Improvement of Biological Time-of-Flight-Secondary Ion Mass Spectrometry Imaging with a Bismuth Cluster Ion Source

David Touboul, Felix Kollmer, Ewald Niehuis, Alain Brunelle, and Olivier Laprévote
J. Am. Soc. Mass Spectrom. 2005, 16 (10), pp 1608-1618

A new liquid metal ion gun (LMIG) filled with bismuth has been fitted to a time-of-flight–secondary ion mass spectrometer (TOF-SIMS). This source provides beams of Bi_n^q+ clusters with n = 1-7 and q = 1 and 2. The appropriate clusters have much better intensities and efficiencies than the Au₃⁺ gold clusters recently used in TOF-SIMS imaging, and allow better lateral and mass resolution. The different beams delivered by this ion source have been tested for biological imaging of rat brain sections. The results show a great improvement of the imaging capabilities in terms of accessible mass range and useful lateral resolution. Secondary ion yields Y, disappearance cross sections σ, efficiencies E = Y/σ , and useful lateral resolutions ΔL have been compared using the different bismuth clusters, directly onto the surface of rat brain sections and for several positive and negative secondary ions with m/z ranging from 23 up to more than 750. The efficiency and the imaging capabilities of the different primary ions are compared by taking into account the primary ion current for reasonable acquisition times. The two best primary ions are Bi₃⁺ and Bi₅²⁺. The Bi₃⁺ ion beam has a current at least five times larger than Au₃⁺ and therefore is an excellent beam for large-area imaging. Bi₅²⁺ ions exhibit large secondary ions yields and a reasonable intensity making them suitable for small-area images with an excellent sensitivity and a possible useful lateral resolution <400 nm.

http://dx.doi.org/10.1016/j.jasms.2005.06.005